A scanning electron microscope (SEM) is a microscope that uses an electron beam to scan a sample's surface to study details of its topography.
Un microscopio electrónico de barrido (MEB) es un microscopio que utiliza un haz de electrones para escanear la superficie de una muestra y estudiar los detalles de su topografía.
| Front | scanning electron microscope (SEM) |
|---|---|
| Back | A microscope that uses an electron beam to scan the surface of a sample to study details of its topography. |
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