Scanning Electron Microscopy (SEM) directs an electron beam onto a specimen, analyzing the scatter pattern to create a 3D image with depth, but requires a vacuum and cannot observe live specimens or color, with a resolution of 20 nm.
- requires vacuum so live specimens cannot be observed - complex staining process - electron beam directed onto specimen - electron scatter pattern analysed computer to produce image - resolution of 20 nm - does not show colour - produces 3-D image with depth
| Front | Describe Scanning Electron Microscopy. (7) |
|---|---|
| Back | - requires vacuum so live specimens cannot be observed - complex staining process - electron scatter pattern analysed computer to produce image - resolution of 20 nm - does not show colour - produces 3-D image with depth |
Tags: microscopy
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